IMAPS Nordic 2002 Conference
Final Programme
Globe
Hotel, Stockholm, Sweden, 29 September - 2 October 2002
Sunday 29 September
Monday 30 September
| 0800 - 1830 |
Registration |
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| 0930 – 1230 |
Workshop on microelectronics R&D management |
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| 1030 – 1100 |
Coffee |
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| 0900 - 1230 |
Tutorial 2 |
Electronic Packaging Reliability |
Horatio Quinones |
| 1230 - 1330 |
Lunch |
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| 1330 - 1530 |
MP1 |
Opening Session |
Paul Collander, Nokia Networks |
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Opening of the Conference |
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Paul Collander, Karel Kurzweil, IMAPS Europe |
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Keynote |
Blue box technologies - a vision of Electronic Packaging and Production research at the end of the decade |
Kåre Gustafsson, Ericsson |
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SOC, SIP, and SOP: The Pros and Cons for Next-generation Convergent Systems |
Rao Tummala, PRC, GeorgiaTech |
| |
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Assembly and Reliability of 3-D System-in-Package
(SiP) |
Eero Ristolainen, Tampere University of Technology |
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Exhibitors' Presentations |
One single minute each |
|
| 1530 – 1615 |
Coffee |
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| 1615 - 1755 |
MP2 |
Flip Chip Processes |
Katarina Boustedt, Ericsson; Jan Vardaman,
TechSearch |
| Chip-on-flex - The trends and possibilities in packaging |
Søren Nørlyng |
Micronsult |
| A Thermode Bonding Process for Fine Pitch Flip Chip Applications on Flexible Substrates |
Barbara Pahl, Christine Kallmayer, Rolf
Aschenbrenner*, Herbert Reichl* |
Technical University of Berlin, *Fraunhofer
Institute of Reliability and Microintegration IZM |
| The Effect Of The Chemistry And The Filler Content Of Capillary Flow Underfill Encapsulants On The Flow
Behaviour, The
Thermomechanical Parameters And The Dielectric Properties At High Frequency |
Tony Winster, G. Luyckx |
Emerson & Cuming |
| Bump & Assembly Technologies For Sub-100 Micron Pitch Flip Chip |
Charles E. Bauer, Wu Fei Jain*, Alexandre Taran* |
TechLead, *Chipbond Technology Corporation
|
| 1630 -1730 |
Poster Session |
Brief oral presentations |
Paul Collander, Nokia Networks |
| Actual Development in the Czech Electronics
Sector |
Ivan Szendiuch |
University of Technology in Brno |
| Point-to-Multipoint Transceiver in LTCC for 26 GHz |
Reinhard Kulke, G. Möllenbeck, W. Simon, A. Lauer, M.
Rittweger |
IMST GmbH |
| Novel Stripline Coupler for Multilayer Ceramic Integrated Circuit
(MCIC) applications |
Sarmad Al-Taei, George Passiopoulos |
Nokia Networks |
| Microwave Circuits in Multilayer ORMOCER
Thin Film |
Christian Johansson |
Linköping Institute of Technology |
| Dispensing adhesive in narrow pattern using a multi-nozzle inkjet head |
W. Voit, M. Alsered*, K. V. Rao**, W. Zapka** |
XaarJet AB, *MA Kapslingsteknik AB, **Royal Institute of Technology |
| Concurrent Thermal and Electrical Analysis of Integral Resistors |
H. Yu, D. Burlacu, J. K. Kivilahti |
Helsinki University of Technology |
| Connectionless Test (CT) using Electromagnetic
Signature |
Mahnaz Salamati, Dag Stranneby |
Örebro University |
| 1800 - 1830 |
|
IMAPS Nordic Annual Meeting |
Paul Collander |
| 1900 - 2100 |
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Buffet dinner in Exhibition |
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Tuesday 1 October
| 0800 - 0940 |
TA1 |
RF and Microwave Packaging |
Paul Collander, Nokia Networks, Peter Barnwell,
Heraeus |
| A Novel Flip Chip Approach For Microwave/High Speed Data Chip Packaging |
Tong Chen
|
Teledyne Technologies, Inc. |
| The RF & Reliability Performance Ratifications of Suspended Ground Planes for BGA type LTCC Modules |
George Passiopoulos, Kevin Lamacraft |
Nokia Networks |
| RF Benchmark up to 40 GHz for various low loss LTCC tapes |
Reinhard Kulke, W. Simon, C. Günner, G. Möllenbeck, D. Köther, M. Rittweger |
IMST GmbH |
| Lumped and distributed element design for LTCC radio filters |
Jens Müller, Claude Guichaoua* |
Micro Systems Engineering GmbH, *Solectron
Brittany |
| 0940 – 1030 |
Coffee |
|
|
| 1030 - 1300 |
TA2
|
System Packaging |
Maja A. Gravad, GN Resound, Karel
Kurzweil, IMAPS Europe |
| µZ-F™ System-in-Package - The Next Generation Multiple Die Package Solution |
Vern Solberg
|
Tessera Technologies, Inc. |
| Multi Substrate Modules – Cheap Solution for 3D Packaging |
Ivan Szendiuch, Josef Sandera, Jaromír Bílek |
University of Technology in Brno |
| Wafer Bonding Technologies for MEMS Packaging |
Katrin Persson, Sofie Bohman, Katarina
Boustedt*, Dag Stranneby* |
Imego, *Örebro University |
| Packaging at the Wafer Level: Worldwide Trends and Applications |
E. Jan Vardaman |
TechSearch |
| Jetting Technology for Microelectronics |
Horatio Quinones, Alec Babiarz,
Christian Deck, Lian Fang |
Asymtek |
| The First 147 Years of OptoElectronics |
Ken Gilleo |
Cookson Electronics |
| 1300 - 1400 |
Lunch |
|
|
| 1400 – 1515 |
TP1 |
Reliability assessment |
Hans Danielsson, Mikroelektronik
Konsult, Kenneth Dahlberg, St. Jude Medical |
| Novel Packages and Packaging Technologies for Use in Harsh Environments |
Peter Frisk, Kristina Hagelin, Mats Lindgren |
Kitron Development AB |
| On the Selection of Die-attach Materials for High Temperature Electronics |
Frøydis Oldervoll, Morten Berg, Jon
Nysæther, Frode Strisland |
SINTEF |
| A Characterisation of Plastic Core Solder Balls for BGA and Flip Chip Applications |
Matthias Klein, Hermann Oppermann, Steffen Behnke, Rolf Aschenbrenner, Herbert Reichl |
Fraunhofer Institute of Reliability and Microintegration IZM Berlin |
| 1515 - 1600 |
Coffee |
|
|
| 1600 - 1805 |
TP2 |
Pb-free and Other Environmental
Issues |
Dag Ausen, SINTEF, Ken Gilleo,
Cookson Electronics |
| Outlining Opportunities of Engineering Processes and Technology on Environmental Impacts of the End of Life Treatment of Mobile Terminals |
Roope Takala, Pia Tanskanen |
Nokia Research Center |
| Results of Life Cycle Assessments of EEE Using Generic Models for Products and Components |
C. Herrmann, P. Eyerer |
IKP |
| Microstructure Investigation of
Sn-Ag-Based Lead-Free Solder Joints by Electron Microscopy |
Liley Ye, Z. H. Lai, J. Liu, A. Thölén |
Chalmers University of Technology |
| Effect of PWB Coatings on the Reliability of
Pb-free CSP Assembly |
T. Mattila, J. K.Kivilahti |
Helsinki University of Technology |
| Anisotropically Conductive Adhesive: An Alternative for Soldering of Small Size Components in Volume Production |
Jarmo Määttänen, Petteri Palm, Pasi
Perttula |
Elcoteq |
| 1930 |
Banquet Dinner |
|
Transportation by bus |
Wednesday 2 October
| 0800 - 1005 |
WA1 |
Advanced board technologies |
Søren Nørlyng, Micronsult, Ivan Szendiuch,
University of Brno |
| Implementation of solid metal bump interconnection technology for high density interconnection and thermal management |
Martin Valfridsson
|
Clover Electronics Co., Ltd. |
| The Importance of Characterization Parameters in Galvanic Process of PCB Manufacturing |
Teija Uusluoto, Paavo Jalonen*, Lenita
Koskinen, Aulis Tuominen |
Pori School of Technology and
Economics,*Satakunta Polytechnic |
| Manufacturing of Flexible Integrated Module Boards |
T.F. Waris, J. K. Kivilahti |
Helsinki University of Technology |
| Status and future of HDI PWBs |
Tarja Rapala-Virtanen |
Aspocomp |
| The Characterisation of Integrated RF Passive Components in LTCC |
Antti Vimpari |
VTT |
| 1005 – 1035 |
Coffee |
|
|
| 1035 - 1240 |
WA2 |
Ceramic high performance materials |
Terho Kutilainen, Asperation, Jens
Müller, MSE |
| Properties of High Definition Photoimaged Conductors in LTCC |
Kari Kautio |
VTT |
| Photoimageable Thick Film Implementation of Very High Density Ceramic Tehnology Products |
Valentinas Baltrusaitis, Jurate
Minalgiene |
Hibridas JSC |
| Generic investigation on 0-shrinkage processed LTCC |
Michael Hintz, Heiko Thust, Erich Polzer* |
Ilmenau Technical University, *DuPont |
| HeraLockTM 2000 Self-constrained LTCC Tape - Benefits and Applications |
Peter Barnwell, Edmar Amaya, Frans Lautzenhiser, James
Wood |
Heraeus |
| The development of a new system of materials for AlN substrates |
Y.L. Wang, A. F. Carroll, J.D. Smith, Y. Cho,
R. J. Bacher, D. K. Anderson, J. C. Crumpton, C. R. S. Needes, J. Cocker, J. Ferguson,
G. Vanrietvelde |
DuPont I-Technologies |
| 1240 - 1250 |
Closing session |
|
Paul Collander |
| 1300 - 1400 |
Lunch (included) |
|
|
| 1400 - 1800 |
Tutorial 3 |
MEMS, MOEMS and RF MEMS
|
Ken Gilleo, Cookson Electronics |
1400 - 1630
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Sponsored seminar |
Critical Aspects in Die Assemblies and LTCC Technology |
Mark McClintick, Mike Ehlert, National Semiconductors |
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