Tutorial 1
Reliability Assurance in Electronics and Photonics – Reliability
Methodology and Electronics Reliability(4h)
Prof. Nihal Sinnadurai
Bligh Manor
The Ferry
Felixstowe
IP11 9RZ UK
Email: sinnadurai@aol.com
Course Description
An intensive tutorial providing the basis and technical training in
reliability over the whole life cycle of products, with particular emphasis on
the physics and mechanisms of failure of electronics. Participants will
understand what aspects of reliability must be addressed and why specific
regimes are different and how vulnerability to reliability can be addressed and
test methods for providing data and assurance.
Course Content:
- Quality and Reliability - how quality can benefit reliability
- Life Cycle Reliability - the Bathtub curve and Reliability Regimes
- Infant mortalities and burn-in at the component level (improving burn-in
throughput, burn-in and ESD hazards) and environmental stress screening (ESS)
at the board level (ESS vs constant temperature burn-in, board level latent
faults)
- Random Failures and their causes (determining Random Failures - are the
handbooks of any use in Designing for Reliability? benefits from best practice
manufacturing and process control)
- Wearout Failures and their causes (accelerated ageing by thermal
overstress, damp heat overstress, the benefits of HAST, cyclic stresses
- Failure mechanisms in electronics components, PCB assemblies; failure
mechanisms and assurance with Pb free assemblies
Who Should Attend
Nihal Sinnadurai is leader in technology and reliability and quality who has
held leading positions in industry with responsibility for development as well
as ensuring high quality standards in the design and build for state-of-the-art
electronics and photonics technologies and products. He is also a Senior Expert
of the UNDP and ITU, and visiting academic at universities in the UK and USA.
Nihal Sinnadurai is also Chair of the IEEE Reliability and CPMT Society in the
UK and RI.
His most recent responsibility was as Global Leader of Reliability and
Quality for Bookham Technology. At Bookham, he led from the front, bringing his
considerable experience and skill to bear in training and counselling the team
members in the skills of reliability and quality and in the interpretation of
the relevant international (Telcordia, IEC, JEDEC, IPC) and customer
specifications, in establishing a clear strategy for Reliability and also for
Quality, in developing the Reliability and delivering Qualification, and also in
ensuring high standards of analysis and reporting. His results included: 2004
Gold Award from Huawei, 2004 Best in Class Gold Star in Reliability and
Qualification from Nortel Networks, increased throughput in reliability
qualification and maintenance of qualification, major threefold reduction in
Customer Returns.
As a freelance technology transfer expert he numbers ITRI (Taiwan), ST
Microelectronics (Global), a number of photonics companies and the European
Commission amongst his international clientele He has project managed European
Commission technology transfer programmes to ensure small and medium enterprises
(SMEs) gain access to leading edge design, foundry and research capabilities and
also research projects to support SMEs. His career also spanned many years at BT
including BT Labs where he had responsibility for Service Management,
Intelligent Networks and VPN developments. He was instrumental in fundamentally
transforming BT policies from overengineering to fitness-for-purpose
specifications. He set the example by developing low-cost high-reliability
subscriber line units for SPC digital exchanges. He was also Professor of
Electronics Technology and the Microelectronics Department Chair at Middlesex
University, Principal Consultant to TWI, and project leader of R&D projects for
the European Commission.
In 2004 he was awarded the Daniel Hughes Award for outstanding technical
achievement in technology and reliability including his inventions and
exploitation of HAST (Highly Accelerated Stress Test) and Liquid Crystal
Microthermography (used globally for measurement and diagnostics).
He gained his university degrees at the University of London in Physics and
Semiconductor Devices and his PhD at the University of Southampton for research
on the Reliability of Silicon and Gallium Arsenide Devices. He is a Chartered
Engineer, a Fellow of the IEEE and a Fellow of the Institute of Physics. He has
considerable practical experience of electronics technologies, testing and
reliability development. He has a number of inventions to his name, has
published over 90 papers and lectures and undertakes Professional Development
training internationally.
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Tutorial 2 Reliability Assurance in
Electronics and Photonics – Photonics Reliability (4h)
Prof. Nihal Sinnadurai
Bligh Manor
The Ferry
Felixstowe
IP11 9RZ UK
Email: sinnadurai@aol.com
Course Description
An intensive tutorial following from the Tutorial on Reliability
Methodology. This focus on Photonics addresses the failure mechanisms of
photonics products both active and passives covering also some novel
technologies. Also addressed are the challenges and relevance of
conventional reliability specifications. Recommendations are made for best
practice in tackling photonics reliability. Participants will understand
how to address reliability and qualification planning, development and
assurance, the limitations of specifications and what information can
usefully be generated and delivered to customers.
- Optoelectronics Devices Failure Mechanisms
- Lasers and transmitter modules, bonding, chip degradation, electrical
transients, testing
- Package related failures
- Peltier coolers
- Photodiodes – PIN, APD
- PIN-FET receivers
- Variable Optical Attenuator
- Adhesives in the optical path
- Critical appraisal of Telcordia technical advisory "reliability assurance
practices for optoelectronic devices in loop applications" - Reliability
Assurance, Common Requirements, Laser Reliability and Quality Criteria,
Special Procedures and Test Methods for Lasers, LED Reliability and Quality
Requirements, Summary tabulation
Who Should Attend?
About the Instructor
Nilhal Sinnadurai, see above under Tutorial 1
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